Application of monolithic polycapillary focusing optics in MXRF
- State Univ. of New York, Albany, NY (United States). Center for X-Ray Optics
- X-Ray Optical Systems, Inc., Albany, NY (United States)
- Oak Ridge Centers for Manufacturing Technology, TN (United States)
A monolithic polycapillary focusing optic, consisting of hundreds of thousands of small tapered glass capillaries, can collect a large solid angle of x rays from a point source and guide them through the capillaries by multiple total reflections to form an intense focused beam. Such a focused beam has many applications in microbeam x-ray fluorescence (MXRF) analysis. Two monolithic polycapillary focusing optics were tested and characterized in a MXRF set-up using a microfocusing x-ray source (50{micro}m {times} 10{micro}m). For the Cu K{sub {alpha}} line, the measured focal spot sizes of these optics were 105{micro}m and 43{micro}m Full-Width-Half-Maximum (FWHM), respectively. When the source was operated at 16W, the average Cu K{sub {alpha}} intensities over the focal spots were measured to be 2.4 {times} 10{sup 4} photons/s/{micro}m{sup 2} and 8.9 {times} 10{sup 4} photons/s/{micro}m{sup 2}, respectively. When the authors compared the monolithic optics to straight monocapillary optics (single channel capillary) with approximately the same output beam sizes, intensity gains of 16 and 44 were obtained. The optics were applied to the MXRF set-up to analyze trace elements in various samples and a Minimum Detection Limit (MDL) of about 2 pg was achieved for the transition elements (V, Cr, Mn, and Fe). The optics were also used to map the distributions of trace elements in various samples.
- OSTI ID:
- 524747
- Report Number(s):
- CONF-960848-; ISBN 0-8194-2247-9; TRN: 97:016738
- Resource Relation:
- Conference: Denver `96: 1. conference on space processing of materials, at SPIE International Society for Optical Engineering (SPIE) annual international symposium on optical science, engineering, and instrumentation, Denver, CO (United States), 4-9 Aug 1996; Other Information: PBD: 1996; Related Information: Is Part Of Hard x-ray/gamma-ray and neutron optics, sensors, and applications; Hoover, R.B.; Doty, F.P. [eds.]; PB: 331 p.; Proceedings/SPIE, Volume 2859
- Country of Publication:
- United States
- Language:
- English
Similar Records
Development of improved x-ray optics for analytical x-ray microbeams. CRADA final report for CRADA Number Y-1294-0283
Polycapillary x-ray optics for thin film strain and texture analysis