Rapid detection of CW residues on soil using an ion trap SIMS
Technology for the rapid detection and identification of chemical warfare (CW) residues on soil samples is being developed at the Idaho National Engineering and Environmental Laboratory (INEEL). The development effort is being undertaken because of a need for rapid and specific characterization for possibly contaminated soils samples, preferably in the field. Secondary ion mass spectrometry (SIMS) is being pursued for these applications because SIMS combines rapid, specific and sensitive surface analyses with the potential for small instrument size. This latter attribute suggests that field characterization using SIMS is possible, and this avenue is being supported by the Army at the INEEL. This paper describes ongoing development efforts focused on the development of small-scale, transportable SIMS instrumentation, and on the application of the technology to likely contamination scenarios.
- Research Organization:
- Idaho National Engineering Lab., Idaho Falls, ID (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States); USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC07-94ID13223
- OSTI ID:
- 542069
- Report Number(s):
- INEL/CON--97-00093; CONF-9705185--; ON: DE97053246
- Country of Publication:
- United States
- Language:
- English
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