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U.S. Department of Energy
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SIMS analysis: Development and evaluation program summary

Technical Report ·
DOI:https://doi.org/10.2172/425266· OSTI ID:425266
This report provides an overview of the ``SIMS Analysis: Development and Evaluation Program``, which was executed at the Idaho National Engineering Laboratory from mid-FY-92 to the end of FY-96. It should be noted that prior to FY-1994 the name of the program was ``In-Situ SIMS Analysis``. This report will not go into exhaustive detail regarding program accomplishments, because this information is contained in annual reports which are referenced herein. In summary, the program resulted in the design and construction of an ion trap secondary ion mass spectrometer (IT-SIMS), which is capable of the rapid analysis of environmental samples for adsorbed surface contaminants. This instrument achieves efficient secondary ion desorption by use of a molecular, massive ReO{sub 4}{sup {minus}} primary ion particle. The instrument manages surface charge buildup using a self-discharging principle, which is compatible with the pulsed nature of the ion trap. The instrument can achieve high selectivity and sensitivity using its selective ion storage and MS/MS capability. The instrument was used for detection of tri-n-butyl phosphate, salt cake (tank cake) characterization, and toxic metal speciation studies (specifically mercury). Technology transfer was also an important component of this program. The approach that was taken toward technology transfer was that of component transfer. This resulted in transfer of data acquisition and instrument control software in FY-94, and ongoing efforts to transfer primary ion gun and detector technology to other manufacturers.
Research Organization:
Lockheed Idaho Technologies Co., Idaho Falls, ID (United States)
Sponsoring Organization:
USDOE Office of Environmental Restoration and Waste Management, Washington, DC (United States)
DOE Contract Number:
AC07-94ID13223
OSTI ID:
425266
Report Number(s):
INEL--96/0431; ON: DE97050810
Country of Publication:
United States
Language:
English