Current-induced vortex dynamics in Josephson-junction arrays: Imaging experiments and model simulations

Journal Article · Mon Sep 01 04:00:00 EDT 1997 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.56.5564· OSTI ID:538584

Lachenmann, S G; Doderer, T; Huebener, R P ^[1]; Hagenaars, T J; van Himbergen, J E; Tiesinga, P H ^[2]; Jose, J V ^[3]

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1. Lehrstuhl Experimentalphysik II, Universitaet Tuebingen, Auf der Morgenstelle 14, D-72076 Tuebingen (Germany)
2. Instituut voor Theoretische Fysica, Princetonplein 5, Postbus 80006, 3508 TA Utrecht (The Netherlands)
3. Department of Physics, and Center for Interdisciplinary Research on Complex Systems, Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115 (United States)

We study the dynamics of current-biased Josephson-junction arrays with a magnetic penetration depth {lambda}{sub {perpendicular}} smaller than the lattice spacing. We compare the dynamics imaged by low-temperature scanning electron microscopy to the vortex dynamics obtained from model calculations based on the resistively shunted junction model, in combination with Maxwell{close_quote}s equations. We find three bias current regions with fundamentally different array dynamics. The first region is the subcritical region, i.e., below the array critical current I{sub c}. The second, for currents I above I{sub c}, is a {open_quotes}vortex region,{close_quotes} in which the response is determined by the vortex degrees of freedom. In this region, the dynamics is characterized by spatial domains where vortices and antivortices move across the array in opposite directions in adjacent rows and by transverse voltage fluctuations. In the third, for still higher currents, the dynamics is dominated by coherent-phase motion, and the current-voltage characteristics are linear. {copyright} {ital 1997} {ital The American Physical Society}

• OSTI ID: 538584
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 9 Vol. 56; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ALUMINIUM COMPOUNDS
DYNAMICS
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
NIOBIUM
PENETRATION DEPTH
SCANNING ELECTRON MICROSCOPY
SIMULATION
TYPE-II SUPERCONDUCTORS
VORTEX FLOW