Defects, vortices, and critical current in Josephson-junction arrays

Journal Article · Mon Sep 25 04:00:00 EDT 1989 · Physical Review Letters; (USA)

DOI:https://doi.org/10.1103/PhysRevLett.63.1428· OSTI ID:5477982

Xia, W; Leath, P L ^[1]

---

1. Department of Physics, Rutgers University, Piscataway, New Jersey 08855-0849 (US)

The breakdown phenomena of resistively shunted two-dimensional Josephson-junction array with a single defect driven by an external current at zero temperature are studied numerically. The nonlinear Josephson relation causes the formation of vortices at the tips of the defect at {ital i}{sub {ital v}} and thus lowers the current enhancement there. Above a higher critical current {ital i}{sub {ital c}} the vortices depin from the defect and march across the sample producing a voltage. The critical current {ital i}{sub {ital c}} is studied versus defect size. Various dynamic properties and the {ital I}-{ital V} characteristics of the array are explained in the context of the vortex motion. From the observed features the critical behavior of a randomly disordered array is predicted.

• OSTI ID: 5477982
• Journal Information: Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 63:13; ISSN PRLTA; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSOLUTE ZERO TEMPERATURE
CRITICAL CURRENT
CRYSTAL STRUCTURE
CURRENTS
DISTRIBUTION
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
FILMS
GRAIN SIZE
JOSEPHSON JUNCTIONS
JUNCTIONS
MAGNETIC FLUX
MICROSTRUCTURE
NUMERICAL SOLUTION
PHYSICAL PROPERTIES
RANDOMNESS
SIZE
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
THIN FILMS
TIME DEPENDENCE