Defects, vortices, and critical current in Josephson-junction arrays

Journal Article · Mon Sep 25 00:00:00 EDT 1989 · Physical Review Letters; (USA)

DOI:https://doi.org/10.1103/PhysRevLett.63.1428· OSTI ID:5477982

Xia, W; Leath, P L ^[1]

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1. Department of Physics, Rutgers University, Piscataway, New Jersey 08855-0849 (US)

The breakdown phenomena of resistively shunted two-dimensional Josephson-junction array with a single defect driven by an external current at zero temperature are studied numerically. The nonlinear Josephson relation causes the formation of vortices at the tips of the defect at {ital i}{sub {ital v}} and thus lowers the current enhancement there. Above a higher critical current {ital i}{sub {ital c}} the vortices depin from the defect and march across the sample producing a voltage. The critical current {ital i}{sub {ital c}} is studied versus defect size. Various dynamic properties and the {ital I}-{ital V} characteristics of the array are explained in the context of the vortex motion. From the observed features the critical behavior of a randomly disordered array is predicted.

• OSTI ID: 5477982
• Journal Information: Physical Review Letters; (USA), Vol. 63:13; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
JOSEPHSON JUNCTIONS
CRITICAL CURRENT
ABSOLUTE ZERO TEMPERATURE
DISTRIBUTION
GRAIN SIZE
MAGNETIC FLUX
NUMERICAL SOLUTION
RANDOMNESS
SUPERCONDUCTIVITY
THIN FILMS
TIME DEPENDENCE
CRYSTAL STRUCTURE
CURRENTS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
FILMS
JUNCTIONS
MICROSTRUCTURE
PHYSICAL PROPERTIES
SIZE
SUPERCONDUCTING JUNCTIONS
420201* - Engineering- Cryogenic Equipment & Devices