Projectile energy dependence of L x-ray emission from fast, highly charged Xe ions traveling in solids

Journal Article · Mon Sep 01 04:00:00 EDT 1997 · Physical Review A

DOI:https://doi.org/10.1103/PhysRevA.56.1904· OSTI ID:538500

Horvat, V; Watson, R L; Blackadar, J M ^[1]

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1. Cyclotron Institute and Department of Chemistry, Texas AM University, College Station, Texas 77843 (United States)

L x-ray emission from Xe ions incident on a variety of solid targets at energies ranging from 6 to 15 MeV/u has been investigated using a curved crystal spectrometer of moderate resolution. Analysis of the spectra provided estimates of the average charges and (in some cases) the charge distributions of those ions emitting L x rays inside the targets. Calculations employing theoretical electron capture and loss cross sections were used to examine the dependence on depth within the target of contributions to the spectra from Xe ions having different average numbers of L and M electrons. Average charges and charge distributions deduced from the x-ray spectra were found to agree quite well with those predicted by the model calculations. {copyright} {ital 1997} {ital The American Physical Society}

• OSTI ID: 538500
• Journal Information: Physical Review A, Journal Name: Physical Review A Journal Issue: 3 Vol. 56; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
BERYLLIUM
CARBON
ELECTRON CAPTURE
EMISSION SPECTRA
ION BEAMS
ION COLLISIONS
K SHELL
LITHIUM
MEV RANGE
POTASSIUM CHLORIDES
SODIUM FLUORIDES
X-RAY SPECTRA
XENON IONS