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Time-of-flight analyzer for ion end loss of a mirror plasma

Journal Article · · Rev. Sci. Instrum.; (United States)
DOI:https://doi.org/10.1063/1.1139840· OSTI ID:5341531
A time-of-flight analyzer has successfully been used to measure the extracted charge-state distribution and impurity level of an ECRH mirror plasma. End-loss temperatures for each ion species have been determined from the rise time of the analyzer output pulses. Ions entering the line-of-sight device are first accelerated by a two-aperture lens and are then focused with an einzel lens. Electrostatic deflection plates chop the ion beam into short pulses which travel down a 1.20-m tube to an electron multiplier. Ion spectra are typically summed at a rate of 1 kHz using a hardware signal averager.
Research Organization:
Plasma Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
OSTI ID:
5341531
Journal Information:
Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 59:4; ISSN RSINA
Country of Publication:
United States
Language:
English