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Radiation effects on GaAs Charge Coupled Devices with high resistivity gate structures

Journal Article · · IEEE Trans. Nucl. Sci.; (United States)

The results of a study on the effects of 1 MeV electrons and 1 MeV neutrons on the operation of high speed GaAs Charge Coupled Devices (CCDs) are presented. Radiation-induced trapping levels are characterized using a linear array CCD structure and the periodic pulse technique. 1 MeV electron irradiation introduced traps at 0.1 eV and 0.39 eV with bulk trap introduction rates of 1 cm/sup -1/ and 0.33 cm/sup -1/, respectively. The devices were irradiated to a maximum fluence of 9 x 10/sup 14/ electrons/cm/sup 2/. 1 MeV neutron irradiation introduced an electron trap level at 0.64 eV with a bulk trap introduction rate of 0.5 cm/sup -1/. Catastrophic device failure occurred at neutron fluences of 6 x 10/sup 13/ neutrons/cm/sup 2/. Device charge transfer efficiency was characterized pre- and post-irradiation over the temperature range of 80/sup 0/K to 300/sup 0/K.

Research Organization:
Air Force Wright Aeronautical Labs., Wright Patterson AFB, OH 45344
OSTI ID:
5325406
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-33:4; ISSN IETNA
Country of Publication:
United States
Language:
English

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