Soft x-ray emission excited resonantly and nonresonantly by synchrotron radiation

Journal Article · Wed Jan 01 04:00:00 EST 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.52273· OSTI ID:531681

Ederer, D L ^[1]; Carlisle, J A ^[2]; Jimenez, J ^[1]; Jia, J J ^[3]; Zhou, L; Callcott, T A ^[3]; Perera, R C ^[4]; Moewes, A ^[5]; Terminello, L J ^[6]; Shirley, E ^[7]; Asfaw, A ^[2]; van Ek, J ^[1]; Morikawa, E ^[5]; Himpsel, F J ^[8]

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1. Tulane University, New Orleans, Louisiana 70118 (United States)
2. Lawrence Livermore National Laboratories, Livermore, California 94551 (United States)
3. University of Tennessee, Knoxville, Tennessee 37996 (United States)
4. Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
5. Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana 70888 (United States)
6. Lawrence Livermore National Laboratories Livermore, California 94551 (United States)
7. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
8. Physics Dept. University of Wisconsin, Madison, Wisconsin 65500 (United States)

This paper is a summary of some of the recent activities of our soft x-ray spectroscopy group. We are using soft x-ray emission spectroscopy to probe the electronic properties of matter, emphasizing atoms in the bulk and at interfaces. In particular we have used incoherent photon excitation to obtain a basic understanding of the electronic properties of a wide variety of materials such as yttrium oxide and titanium diboride, we have used the penetrating power of x-rays to study multilayers of silicon and iron and have shown that iron silicide is present in the silicon layer and provides evidence that in the antiferromagnetic Fe/Si multilayer system the FeSi{sub 2} layer is conducting rather than insulating. The ubiquitous presence of Raman scattering has been used to elucidate the electronic band structure of materials including graphite and hexagonal boron nitride. Such scattering can produce dramatic changes in the emission spectrum that can further the basic understanding of the electronic band structure. We have made a systematic study of Raman scattering in several transition metal compounds, including their borides, oxides, and sulfides. Photon-in photon-out soft x-ray spectroscopy has many applications, and is adding a new dimension to soft x-ray spectroscopy by providing many opportunities for exciting research, especially at third generation synchrotron light sources. {copyright} {ital 1997 American Institute of Physics.}

• Research Organization: Brookhaven National Laboratory
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76CH00016; AC03-76SF00098
• OSTI ID: 531681
• Report Number(s): CONF-9609283--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 389; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ELECTRONIC STRUCTURE
IRON
LAYERS
RAMAN SPECTRA
SILICON
SOFT X RADIATION
SYNCHROTRON RADIATION
TITANIUM BORIDES
X-RAY EMISSION ANALYSIS
YTTRIUM OXIDES