Fast-timing methods for semiconductor detectors
The basic parameters are discussed which determine the accuracy of timing measurements and their effect in a practical application, specifically timing with thin-surface barrier detectors. The discussion focusses on properties of the detector, low-noise amplifiers, trigger circuits and time converters. New material presented in this paper includes bipolar transistor input stages with noise performance superior to currently available FETs, noiseless input terminations in sub-nanosecond preamplifiers and methods using transmission lines to couple the detector to remotely mounted preamplifiers. Trigger circuits are characterized in terms of effective rise time, equivalent input noise and residual jitter.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA); Gesellschaft fuer Schwerionenforschung m.b.H., Darmstadt (Germany, F.R.). UNILAC-Gruppe
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5309446
- Report Number(s):
- LBL-14145; CONF-811012-62; ON: DE82013003
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFIERS
DIGITIZERS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FIELD EFFECT TRANSISTORS
MEASURING INSTRUMENTS
NOISE
PULSE CIRCUITS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
TIMING CIRCUITS
TRANSISTORS
TRIGGER CIRCUITS