Nanometer-scale mechanics of gold films

Journal Article · Sun Nov 14 23:00:00 EST 1993 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.71.3319· OSTI ID:5305840

Tangyunyong, P; Thomas, R C; Houston, J E; Michalske, T A; Crooks, R M; Howard, A J ^[1]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States) Department of Chemistry, University of New Mexico, Albuquerque, New Mexico 87185 (United States)

We have used interfacial force microscopy (IFM) to monitor the mechanical deformation of single nanometer-size grains in Au thin films. Our results show that protruding grains, which represent early-stage delamination, display multiple deformation mechanisms including grain-boundary sliding and intragranular plasticity. The unprecedented load-displacement control capability of the IFM provides data that are used for the first time to quantitatively distinguish and evaluate individual deformation processes.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5305840
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 71:20; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102 -- Metals & Alloys-- Structure & Phase Studies
360103* -- Metals & Alloys-- Mechanical Properties
CRYSTALS
DEFORMATION
ELASTICITY
ELEMENTS
FILMS
GOLD
GRAIN BOUNDARIES
GRAIN SIZE
GRANULAR MATERIALS
MATERIALS
MECHANICAL PROPERTIES
METALS
MICROSCOPY
MICROSTRUCTURE
PHASE STABILITY
PLASTICITY
POLYCRYSTALS
SIZE
STABILITY
TENSILE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS