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Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers

Journal Article · · Journal of Applied Physics; (USA)
DOI:https://doi.org/10.1063/1.343807· OSTI ID:5301381
; ; ; ; ;  [1]
  1. Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania, 15213-3890 (US)
The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO{sub 3} between the YSZ and the YBCO has been shown by cross-sectional TEM.
OSTI ID:
5301381
Journal Information:
Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 66:10; ISSN 0021-8979; ISSN JAPIA
Country of Publication:
United States
Language:
English