High critical current densities of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} thin films on buffered technical substrates

Journal Article · Fri Jan 31 23:00:00 EST 1997 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.118326· OSTI ID:450200

Knierim, A; Auer, R; Geerk, J; Linker, G; Meyer, O; Reiner, H; Schneider, R ^[1]

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1. Forschungszentrum Karlsruhe, INFP and ITP, D 76021 Karlsruhe (Germany)

C-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} (YBCO) thin films were deposited on polycrystalline metallic tapes buffered with yttria stabilized zirconia (YSZ). The in-plane alignment of the YSZ layers achieved by simultaneous ion bombardment of the growing film (ion beam assisted deposition) and of the postdeposited YBCO thin films was studied by x-ray diffraction as a function of the buffer layer thickness. A significant improvement of the in-plane texture, achieved for buffer layers exceeding a thickness of about 1.5 {mu}m, resulted in high critical current densities above 10{sup 6} A/cm{sup 2} of the YBCO films. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 450200
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 5 Vol. 70; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
COPPER OXIDES
CRITICAL CURRENT
CRYSTAL STRUCTURE
CURRENT DENSITY
HIGH-TC SUPERCONDUCTORS
SUPERCONDUCTING FILMS
SUPERCONDUCTING WIRES
THIN FILMS
X-RAY DIFFRACTION
YTTRIUM OXIDES