Anodic film formation on a sputter-deposited amorphous Al{endash}40 at.{percent} Sm alloy

Journal Article · Tue Jul 01 04:00:00 EDT 1997 · Journal of Materials Research

DOI:https://doi.org/10.1557/JMR.1997.0258· OSTI ID:528009

Habazaki, H; Skeldon, P; Thompson, G E; Wood, G C ^[1]; Shimizu, K ^[2]

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1. Corrosion and Protection Centre, University of Manchester Institute of Science and Technology, P.O. Box 88, Manchester (England)
2. Department of Chemistry, Keio University, 3-1-14, Hiyoshi, Yokohama 223 (Japan)

The mechanism of ionic transport in the amorphous anodic film formed on Al{endash}40 at.{percent} Sm alloy has been examined by transmission electron microscopy and Rutherford backscattering spectroscopy. The film consists of an outer layer, about 6{percent} of the total film thickness, composed of relatively pure Sm{sub 2}O{sub 3} and an inner layer containing units of Al{sub 2}O{sub 3} and Sm{sub 2}O{sub 3} distributed homogeneously at the available resolution. The anodic film material is formed by migration of O{sup 2{minus}}/OH{sup {minus}} ions inwards and migration of cations outward, with a cation transport number about 0.29. The two-layered film develops as a consequence of faster migration of Sm{sup 3+} ions than Al{sup 3+} ions in the film. {copyright} {ital 1997 Materials Research Society.}

• OSTI ID: 528009
• Journal Information: Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 7 Vol. 12; ISSN JMREEE; ISSN 0884-2914
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM ALLOYS
ANODIZATION
ATOM TRANSPORT
CHEMICAL BONDS
ION MOBILITY
IONIC CONDUCTIVITY
METALLIC GLASSES
PROTECTIVE COATINGS
SAMARIUM ALLOYS
THIN FILMS