Exponential decay and exponential recovery of modal gains in high count rate channel electron multipliers

Journal Article · Tue Jul 01 04:00:00 EDT 1980 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1136329· OSTI ID:5268715

Hahn, S F; Burch, J L

A series of data on high count rate channel electron multipliers revealed an initial drop and subsequent recovery of gains in exponential fashion. The FWHM of the pulse height distribution at the initial stage of testing can be used as a good criterion for the selection of operating bias voltage of the channel electron multiplier.

• Research Organization: Southwest Research Institute, San Antonio, Texas 78284
• OSTI ID: 5268715
• Journal Information: Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 51:7; ISSN RSINA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
DATA
DISCRIMINATORS
ELECTRIC POTENTIAL
ELECTRON MULTIPLIERS
ELECTRON TUBES
ELECTRONIC CIRCUITS
GAIN
INFORMATION
OPTIMIZATION
PULSE CIRCUITS
PULSE DISCRIMINATORS
PULSES
VARIATIONS