Avalanche-transistor bridge scanning circuit for electron-optical camera with picosecond resolution

Journal Article · Thu May 01 04:00:00 EDT 1986 · Instrum. Exp. Tech. (Engl. Transl.); (United States)

OSTI ID:5256909

Gilev, A K; Demchuk, M I; Dmitriev, S M; Lebedev, V B; Mikhailov, V P

This paper describes a scanning circuit for the Agat-SF-1 electron-optical camera implemented by KT603A transistors in the avalanche mode in a bridge circuit. The scanning circuit generates a voltage drop of 4 kV with a switching time of 2 nsec. The obtained scanning speed of the camera is 4.35.10/sup 9/ cm/sec. The device has increased reliability and longevity and is insensitive to transistor selection and supply-voltage variations.

• Research Organization: Sci-Res. Institute of Applied Physics Problems, Minsk
• OSTI ID: 5256909
• Journal Information: Instrum. Exp. Tech. (Engl. Transl.); (United States), Journal Name: Instrum. Exp. Tech. (Engl. Transl.); (United States) Vol. 28:6, PT. 1; ISSN INETA
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
BEAM MONITORS
BEAM SCANNERS
CALIBRATION
CAMERAS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
LASER RADIATION
LASERS
MEASURING INSTRUMENTS
MONITORS
PULSE CIRCUITS
PULSE RISE TIME
PULSES
RADIATIONS
RELIABILITY
RESOLUTION
SEMICONDUCTOR DEVICES
SENSITIVITY
SOLID STATE LASERS
TIME RESOLUTION
TIMING PROPERTIES
TRANSISTORS
TRIGGER CIRCUITS
VOLTAGE DROP