Exchange anisotropy in amorphous Co-Gd films, II

Conference · Fri Sep 01 04:00:00 EDT 1989 · IEEE (Institute of Electrical and Electronics Engineers) Transactions on Magnetics; (USA)

OSTI ID:5246739

Toxen, A M; Hopkins, A; Hagstrom, S B ^[1]; White, R M ^[2]

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1. Stanford Univ., CA (USA)
2. Control Data Corp., Minneapolis, MN (USA)

The authors report the results of magnetization, transmission electron microscopy, and x-ray diffraction studies of GdCo/sub x/ films sputtered onto Si or sapphire substrates at --90 C, ambient temperature. The composition range studied was x=2-8.5. Over the composition range defined approximately by 5>x>3, the films, which are 103 microns thick, exhibit a unidirectionally displaced B-H loop, characteristic of an exchange-coupled phase. TEM studies indicated that the samples with the shifted loops indeed consist of a mixture of amorphous and microcrystalline phases.

• OSTI ID: 5246739
• Report Number(s): CONF-890309--
• Conference Information: Journal Name: IEEE (Institute of Electrical and Electronics Engineers) Transactions on Magnetics; (USA) Journal Volume: 25:5
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
360603 -- Materials-- Properties
656003 -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
AMORPHOUS STATE
ANISOTROPY
CHALCOGENIDES
CHEMICAL COMPOSITION
COBALT COMPOUNDS
COHERENT SCATTERING
CORUNDUM
DIAGRAMS
DIFFRACTION
ELECTRON MICROSCOPY
ELEMENTS
FILMS
GADOLINIUM COMPOUNDS
MAGNETIZATION
MICROSCOPY
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHASE DIAGRAMS
RARE EARTH COMPOUNDS
SAPPHIRE
SCATTERING
SEMIMETALS
SILICON
SPUTTERING
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION