GaAs MMIC: recovery from upset by x-ray pulse

Conference · Tue Dec 31 23:00:00 EST 1985

OSTI ID:5236391

Armendariz, M G; Castle, Jr, J G

Tolerance for fast neutrons and total ionizing dose is a feature of GaAs microwave monolithic integrated circuits (MMIC). However, upset during an ionizing pulse is expected to occur and delayed recovery due to backgating may be a problem. The purpose of this study of an experimental MMIC design is to observe the recovery of oscillator power output following upset by a short ionizing pulse as a function of applied bias, dose per pulse and case temperature.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5236391
• Report Number(s): SAND-86-0697C; CONF-861164-1; ON: DE86014109
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FAST NEUTRONS
FERMIONS
HADRONS
INTEGRATED CIRCUITS
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
NEUTRONS
NUCLEONS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
X RADIATION