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Surface layers of group-IVA metals with implanted silicon ions

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:5222649
The implantation of Si/sup +/ ions with an energy of 30 or 16 keV into Ti, Zr, or Hf at room temperature causes amorphization of the surface layer of the metal. During annealing at 870 K the amorphous layer of hafnium and titanium with implanted Si atoms is transformed into an amorphous HfO/sub 2m/ or TiO/sub 2/ solid solution with Si as a result of reaction with the oxygen in the residual atmosphere and this solid solution prevents further oxidation of the metal; the layer of amorphous alloy is thermally stable up to 1270 K. When Zr with implanted Si ions is annealed at a temperature no higher than 870 K the surface amorphous layer is oxidized in the residual atmosphere of oxygen and is crystallized as ZrO/sub 2/. Similar phenomena are observed in the case of hafnium, which has been implanted with oxygen ions or a small dose of silicon ions. The thermal stability of amorphous layers obtained through Si ion implantation into Ti, Zr, of Hf is consistent with the scale resistance of monolithic alloys in the Ti-Si, Zr-Si, and Hf-Si systems
Research Organization:
A. A. Baikov Institute of Metallurgy (USSR)
OSTI ID:
5222649
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 23:6; ISSN INOMA
Country of Publication:
United States
Language:
English