In situ tip exchange mechanism for the Demuth-type scanning tunneling microscope
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
- Matsushita Central Research Lab., Osaka (Japan)
- Tokoku Univ., Sendai (Japan) Univ. of Tokyo (Japan)
- Matsushita Research Inst., Kawasaki (Japan)
The probing tip plays a most important role on the performance and resolution of the scanning tunneling microscope (STM). If damaged, the tip must be replaced, ideally without breaking the ultrahigh vacuum conditions of the STM. The authors have developed a new in situ tip-exchange device for the widely-used Demuth-type STM without compromising the performance and simplicity of the system. The device described here be incorporated into any STM system with an in-situ sample exchange mode.
- OSTI ID:
- 5221535
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:2; ISSN 0734-211X; ISSN JVTBD
- Country of Publication:
- United States
- Language:
- English
Similar Records
In situ scanning tunneling microscope tip treatment device for spin polarization imaging
Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope
Variable-temperature independently driven four-tip scanning tunneling microscope
Patent
·
Tue Apr 22 00:00:00 EDT 2008
·
OSTI ID:985159
Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope
Journal Article
·
Thu Feb 29 19:00:00 EST 2024
· Review of Scientific Instruments
·
OSTI ID:2578451
Variable-temperature independently driven four-tip scanning tunneling microscope
Journal Article
·
Tue May 15 00:00:00 EDT 2007
· Review of Scientific Instruments
·
OSTI ID:20953446