skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Growth of epitaxical SiC layers onto on- and off-axis 6H-SiC substrates by ion beam deposition

Conference ·
OSTI ID:5213718

Thin films of {beta}-SiC have been grown epitaxically onto on-axis (0001) 6H {alpha}-SiC substrates using ion beam deposition. The ion beam deposition technique involves the direct deposition of alternating layers of {sup 13}C{sup +} and {sup 30}Si{sup +}. The carbon and silicon ions were obtained from an ion implanter by decelerating mass-analyzed ion beams to 40 eV. The SiC substrate was held at {approximately}973 K. Thin films of {alpha}-SiC (a mixture of {alpha}-polytypes) were obtained following deposition onto off-axis ({approximately}2{degree}) 6H {alpha}-SiC. High resolution electron microscopy and Rutherford backscattering techniques were used to determine the structure and crystalline perfection of the resulting layers.

Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE/CE; DOE/ER
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5213718
Report Number(s):
CONF-891119-39; ON: DE90004236
Resource Relation:
Conference: Materials Research Society fall meeting, Boston, MA (USA), 27 Nov - 2 Dec 1989
Country of Publication:
United States
Language:
English