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U.S. Department of Energy
Office of Scientific and Technical Information

Material growth and characterization for solid state devices. Final report, 1 December 1983-31 May 1988

Technical Report ·
OSTI ID:5211789
During the period of this research grant, the process of liquid phase electroepitaxy (LPEE) was used to grow ternary and quaternary alloy III-V semiconductor thin films. Selective area growth of InGaAs was performed on InP substrates using a patterned sputtered quartz or spin-on glass layer. The etch back and growth characteristics with respect to substrate orientation were investigated. The etch back behavior is somewhat different from wet chemical etching with respect to the sidewall profiles which are observed. LPEE was also employed to grow epitaxial layers of InGaAsP alloys on InP substrates. The behavior of Mn as an acceptor dopant was investigated with low temperature Hall coefficient and photoluminescence measurements. A metal-organic vapor phase epitaxy system was partially complete within the grant period. This atmospheric pressure system will be used to deposit III-V compound and alloy semiconductor layers in future research efforts.
Research Organization:
North Carolina Agricultural and Technical State Univ., Greensboro, NC (USA)
OSTI ID:
5211789
Report Number(s):
N-89-30096; NASA-CR--183196; NAS--1.26:183196
Country of Publication:
United States
Language:
English