Improvements in the structure and adhesion of electrodeposited thin film CdSe

Journal Article · · Chemistry of Materials; (United States)

OSTI ID:5204037

Wynands, H; Cocivera, M ^[1]

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1. Univ. of Guelph, Ontario (Canada)

CdSe was electrodeposited onto treated and untreated indium-tin oxide coated glass substrates (ITO). CdSe deposited onto untreated ITO was smooth and featureless on the micron scale but was cracked after deposition and frequently flaked off the substrate after an annealing treatment. Adherent and crack-free CdSe films were deposited onto modified ITO substrates. Two types of substrate treatments were used prior to CdSe deposition: (1) thermal treatment of ITO with an elemental vapor of Se, Cd, or In; (2) electrochemical reduction to form Se, Cd, or In on the surface. Scanning electron microscopy and x-ray diffraction were used to study the surface and structure of both the modified substrates and the electrodeposited CdSe films. After removal from the conductive substrate, the resistivity of thin film CdSe was measured as a function of temperature. The morphology and electrical properties of the CdSe were shown to be dependent on the type of substrate treatment used.

• OSTI ID: 5204037
• Journal Information: Chemistry of Materials; (United States), Journal Name: Chemistry of Materials; (United States) Vol. 3:1; ISSN CMATE; ISSN 0897-4756
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
360602 -- Other Materials-- Structure & Phase Studies
360603 -- Materials-- Properties
ADHESION
CADMIUM COMPOUNDS
CADMIUM SELENIDES
CHALCOGENIDES
COHERENT SCATTERING
DATA
DEPOSITION
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRODEPOSITION
ELECTROLYSIS
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
FILMS
INFORMATION
LYSIS
MICROSCOPY
MORPHOLOGY
NUMERICAL DATA
PHYSICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SCATTERING
SELENIDES
SELENIUM COMPOUNDS
SURFACE COATING
TEMPERATURE DEPENDENCE
THIN FILMS
X-RAY DIFFRACTION