Dielectronic capture processes in the electron-impact ionization of Sc[sup 2+]
Journal Article
·
· Physical Review A; (United States)
- Department of Physics, Auburn University, Auburn, Alabama 36849 (United States)
- Department of Physics Applied Physics, University of Strathclyde, Glasgow G4 ONG (United Kingdom)
- Department of Physics, Rollins College, Winter Park, Florida 32749 (United States)
- Institut fur Kernphysik, Universitat Giessen, D-35392 Giessen (Germany)
- Institut fur Strahlenphysik, Universitat Stuttgart, D-70550 Stuttgart (Germany)
- Joint Institute for Laboratory Astrophysics, Boulder, Colorado 80309 (United States)
Theoretical and experimental results are presented for the electron-impact ionization of Sc[sup 2+] in the near-threshold energy region where strong resonance features due to dielectronic capture processes are found. The indirect ionization contributions are calculated in the close-coupling approximation. Both absolute and scan measurements for the ionization cross section are obtained in a crossed-beams experimental geometry. The overall agreement between theory and experiment is good, once a sufficient number of singly excited states are included in the close-coupling expansion. The additional states allow a proper theoretical determination of the decay pathways available to the resonances formed following dielectronic capture of the incident electron.
- DOE Contract Number:
- FG05-86ER53217; AC05-84OR21400; AI05-86ER53237
- OSTI ID:
- 5189979
- Journal Information:
- Physical Review A; (United States), Journal Name: Physical Review A; (United States) Vol. 49:2; ISSN 1050-2947; ISSN PLRAAN
- Country of Publication:
- United States
- Language:
- English
Similar Records
Strong contributions of indirect processes to the electron-impact ionization cross section of Sc{sup +} ions
Ejected-energy differential cross sections for the near-threshold electron-impact ionization of hydrogen
Indirect processes in electron impact ionization of positive ions
Journal Article
·
Fri Oct 01 00:00:00 EDT 2004
· Physical Review. A
·
OSTI ID:20646377
Ejected-energy differential cross sections for the near-threshold electron-impact ionization of hydrogen
Journal Article
·
Tue May 01 00:00:00 EDT 2001
· Physical Review A
·
OSTI ID:40206045
Indirect processes in electron impact ionization of positive ions
Journal Article
·
Fri Dec 30 23:00:00 EST 1994
· Advances in Atomic, Molecular, and Optical Physics
·
OSTI ID:459498
Related Subjects
664300* -- Atomic & Molecular Physics-- Collision Phenomena-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
CAPTURE
CATIONS
CHARGED PARTICLES
COLLISIONS
ELECTRON COLLISIONS
ELECTRON-ION COLLISIONS
ENERGY
ENERGY LEVELS
EXCITED STATES
INELASTIC SCATTERING
ION COLLISIONS
IONIZATION
IONS
RESONANCE SCATTERING
SCANDIUM IONS
SCATTERING
THRESHOLD ENERGY
74 ATOMIC AND MOLECULAR PHYSICS
CAPTURE
CATIONS
CHARGED PARTICLES
COLLISIONS
ELECTRON COLLISIONS
ELECTRON-ION COLLISIONS
ENERGY
ENERGY LEVELS
EXCITED STATES
INELASTIC SCATTERING
ION COLLISIONS
IONIZATION
IONS
RESONANCE SCATTERING
SCANDIUM IONS
SCATTERING
THRESHOLD ENERGY