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Kinetics and dynamics on Si(100)

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.585532· OSTI ID:5189306
; ;  [1]
  1. Texas A and M Univ., College Station (United States)
The motion of Si atoms at a Si(100) surface on both short ({approximately} 1ps) and long ({approximately} 1s) time scales is the subject of this paper. It is found that silicon atoms in the surface layer can form dimers within a time of order 1 ps. An interesting switching between symmetric and asymmetric dimers is observed in some runs. In others, the coexistence of symmetric and asymmetric dimers is observed. On a long time scale, stochastic modeling is used to simulate adsorption, diffusion, and growth. While deposition of Si atoms continues on vicinal Si(100), there is a tendency toward a one-domain surface with double steps. When deposition is turned off, diffusion leads to a two-domain surface with single steps. These conclusions are consistent with recent scanning tunneling microscopy and reflection high-energy electron diffraction observations.
OSTI ID:
5189306
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:2; ISSN 0734-211X; ISSN JVTBD
Country of Publication:
United States
Language:
English