High-temperature X-ray diffraction study on stability of the infinite-layer SrCuO{sub 2}

Journal Article · Thu Sep 01 00:00:00 EDT 1994 · Journal of Solid State Chemistry

DOI:https://doi.org/10.1006/jssc.1994.1291· OSTI ID:518213

Zhou, Xingjiang; Dong, Cheng; Wu, Fei ^[1]

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1. Inst. of Physics, Beijing (China); and others

The stability of the infinite-layer SrCuO{sub 2} upon heating in air has been investigated by high-temperature X-ray diffraction. Above 300{degrees}C the infinite-layer SrCuO{sub 2} reacted gradually with CO{sub 2} in air to form SrCO{sub 3}; at a temperature over 400{degrees}C, the infinite-layer SrCuO{sub 2} transformed into orthorhombic SrCuO{sub 2}, with an abrupt decrease of the amount of the infinite-layer phase in the sample. The lattice parameters a and c of the infinite-layer SrCuO{sub 2} showed different thermal expansion coefficients, i.e., da/dT = 3.329 x 10{sup {minus}5} and dc/dT = 5.801 x 10{sup {minus}5} {angstrom}/{degrees}C.

• Sponsoring Organization: USDOE
• OSTI ID: 518213
• Journal Information: Journal of Solid State Chemistry, Vol. 112, Issue 1; Other Information: PBD: Sep 1994
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
STRONTIUM OXIDES
THERMAL EXPANSION
COPPER OXIDES
LATTICE PARAMETERS
X-RAY DIFFRACTION