Scanning force/tunneling microscopy of a graphite surface in air

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)

DOI:https://doi.org/10.1116/1.585267· OSTI ID:5159916

Sugawara, Y ^[1]; Ishizaka, T ^[2]; Morita, S ^[3]

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1. Iwate Univ., Morioka (Japan)
2. Tohoku Univ., Sendai (Japan)
3. Hiroshima Univ. (Japan)

The authors discuss atomic resolution imaging of a graphite surface in air by simultaneously measuring repulsive contact forces and surface conductance with the scanning force/tunneling microscope (AFM/STM) under two types of operating modes: the constant height mode and the constant current mode. The authors also discuss the coherence of the images during simultaneous imaging with the AFM/STM, and further clarify the measurement condition for simultaneous imaging.

• OSTI ID: 5159916
• Journal Information: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:2; ISSN 0734-211X; ISSN JVTBD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
AIR
CARBON
ELECTRICAL PROPERTIES
ELEMENTAL MINERALS
ELEMENTS
FLUIDS
GASES
GRAPHITE
MATHEMATICS
MICROSCOPY
MINERALS
NONMETALS
PHYSICAL PROPERTIES
SURFACE PROPERTIES
TOPOLOGY
TUNNEL EFFECT