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Hydrogen diffusion and desorption in rf-sputter-deposited hydrogenated amorphous germanium

Journal Article · · Physical Review, B: Condensed Matter; (United States)
;  [1];  [2]
  1. Ames Lab., IA (United States) Iowa State Univ. of Science and Technology, Ames, IA (United States). Dept. of Physics and Astronomy
  2. Iowa State University, Ames, Iowa (USA). Microelectronics Research Center

Long-range hydrogen motion and desorption at temperatures 180{le}{ital T}{le}310 {degree}C in rf-sputter-deposited hyrogenated amorphous germanium ({ital a}-Ge:H) of varying Ge-bonded H content {ital C}{sub H} was studied by secondary-ion mass spectrometry (SIMS) and ir absorption. As in hydrogenated amorphous silicon ({ital a}-Si:H), the diffusion constant {ital D}({ital t}) decreases with time as {ital D}{sub 00}({omega}{ital t}){sup {minus}{alpha}}. In films of initial H content 5.0{le}{ital C}{sub H0}{le}7.4 at. %, {alpha}{congruent}0.40 is independent of {ital T} and {ital C}{sub H0}. In a film of {ital C}{sub H0}{congruent}9.5 at. %, suspected to contain a significant microvoid content, {alpha}{congruent}0.65 is also independent of {ital T}. In contrast to undoped {ital a}-Si:H, {ital C}{sub H} decreases during annealing at temperatures as low as 180 {degree}C. H diffusion to the nearest microvoid and molecular recombination at its surface are therefore suspected to strongly affect the value of {alpha}.

DOE Contract Number:
W-7405-ENG-82
OSTI ID:
5154270
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 44:12; ISSN PRBMD; ISSN 0163-1829
Country of Publication:
United States
Language:
English