Surfaces of high-T/sub c/ Nb/sub 3/Ge films as studied by electron tunneling and auger electron spectroscopy

Conference · Sun Jan 01 00:00:00 EST 1978 · AIP Conf. Proc.; (United States)

OSTI ID:5153086

Buitrago, R; Toth, L E; Goldman, A M; Dayan, M

Auger electron spectroscopy (AES) has been used to understand the nature of the surfaces of the top atomic layers of high-T/sub c/ sputter-deposited films of Nb/sub 3/Ge. Pb-Nb/sub 3/Ge tunneling junctions of high quality have been fabricated with oxidized thin aluminum barriers.

• Research Organization: Univ. of Minnesota, Minneapolis
• OSTI ID: 5153086
• Report Number(s): CONF-780339-
• Journal Information: AIP Conf. Proc.; (United States), Vol. 44; Conference: Conference on future trends in superconductive electronics, Charlottesville, VA, USA, 23 Mar 1978
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
GERMANIUM COMPOUNDS
SPUTTERING
JOSEPHSON JUNCTIONS
FABRICATION
NIOBIUM COMPOUNDS
DEPOSITION
ELECTRON SPECTROSCOPY
FILMS
SUPERCONDUCTORS
SPECTROSCOPY
SUPERCONDUCTING JUNCTIONS
TRANSITION ELEMENT COMPOUNDS
420201* - Engineering- Cryogenic Equipment & Devices