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Josephson properties of Nb/sub 3/Ge/oxide/Pb tunnel junctions

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.94802· OSTI ID:5151721
Nb/sub 3/Ge/oxide/Pb Josephson tunnel junctions have been fabricated on magnetron-sputtered Nb/sub 3/Ge thin films using standard photolithography and a CF/sub 4/ plasma cleaning technique. Their Josephson properties have also been investigated. High-quality junctions with a well-defined large gap (approx.5 mV) and low excess conductance (V/sub m/ = 35 mV) can be obtained by adopting large-grained high-T/sub c/ films. These junctions are found to have an Nb/sub 3/Ge magnetic penetration depth of less than 200 nm, and a specific capacitance a little lower than that for Nb/Nb oxide/Pb junctions.
Research Organization:
Ibaraki Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Tokai, Ibaraki 319-11, Japan
OSTI ID:
5151721
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 44:5; ISSN APPLA
Country of Publication:
United States
Language:
English