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Determination of critical micelle concentrations in micellar and reversed micellar systems by positron annihilation techniques

Journal Article · · J. Am. Chem. Soc.; (United States)
DOI:https://doi.org/10.1021/ja00471a061· OSTI ID:5149206

The applicability of the positron annihilation technique is discussed as a simple method for the accurate determination of the critical micelle concentration (cmc). The results of a preliminary study of positron interactions in solutions with various amounts of surfactants present are reported. The six different micellar systems studied were dodecylammonium propionate in benzene, cyclohexane, and n-hexane; sodium di(2-ethylhexyl)sulfosuccinate in benzene; sodium decylsulfate and decyltrimethylammonium bromide in water. The tabulated results indicated that this technique was applicable to the determination of cmc's in both aqueous and nonaqueous solutions. (BLM)

Research Organization:
Virginia Polytechnic Inst. and State Univ., Blacksburg
OSTI ID:
5149206
Journal Information:
J. Am. Chem. Soc.; (United States), Journal Name: J. Am. Chem. Soc.; (United States) Vol. 100:3; ISSN JACSA
Country of Publication:
United States
Language:
English