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Effect of temperature and counterion on the micelle formation process studied by positron annihilation techniques

Journal Article · · J. Phys. Chem.; (United States)
DOI:https://doi.org/10.1021/j100482a011· OSTI ID:6197199

The positron annihilation technique was applied to the study of the micelle formation process in micellar systems Aerosol OT and dodecylammonium propionate (DAP) in apolar solvents, such as benzene and isooctane. At certain surfactant concentrations abrupt changes in the number of thermal o-Ps atoms formed can be observed. The surfactant concentration at which this effect can be seen is widely temperature independent in Aerosol OT solutions while a significant shift to higher surfactant concentrations can be found with increasing temperature in DAP solutions. The effect of the nature of the counterion on the mechanism of micelle formation is further investigated by substituting the counterion Na/sup +/ in Aerosol OT by tetraalkylammonium ions, N/sup +/H/sub 4/, N/sup +/(CH/sub 3/)/sub 4/, and N/sup +/(C/sub 2/H/sub 5/)/sub 4/. The results are discussed in terms of the pseudophase model and multiple equilibrium model for micelle formation.

Research Organization:
Virginia Polytechnic Inst. and State Univ., Blacksburg
OSTI ID:
6197199
Journal Information:
J. Phys. Chem.; (United States), Journal Name: J. Phys. Chem.; (United States) Vol. 83:19; ISSN JPCHA
Country of Publication:
United States
Language:
English