X-ray multilayers for diffractometers, monochromators, and spectrometers; Proceedings of the Meeting, San Diego, CA, Aug. 17-19, 1988

Conference · Fri Jan 01 04:00:00 EST 1988

OSTI ID:5138326

Christensen, F E

Various papers on X-ray multilayers for diffractometers, monochromators, and spectrometers are presented. The general topics addressed include: multilayer monochromators for X-rays and neutrons; multilayer fabrication and characterization; modeling; multilayer substrates and characterization; design and applications of multilayer spectrometers; and specialized multilayer devices. Individual subjects considered include: monochromator based on W/C multilayers of 40 A layer spacing; comparison among multilayer soft X-ray mirrors fabricated by electron, beam, dc, RF-magnetron sputtering, and ion beam sputtering deposition; soft X-ray multilayers produced by sputtering and molecular beam epitaxy: substrate and interfacial roughness; effects of surface quality upon the performance of normal incidence X-ray/XUV imaging systems; recent results in multilayer research; design of an imaging microscope for soft-X-ray applications; and assessment of multilayer mirror for XUV laser use.

• OSTI ID: 5138326
• Report Number(s): CONF-8808285--
• Country of Publication: United States
• Language: English

Related Subjects

440000* -- Instrumentation
47 OTHER INSTRUMENTATION
BREMSSTRAHLUNG
COHERENT SCATTERING
DIFFRACTION
DIFFRACTOMETERS
ELECTROMAGNETIC RADIATION
FABRICATION
MEASURING INSTRUMENTS
MEETINGS
MIRRORS
MONOCHROMATORS
NEUTRON SPECTROMETERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATION DETECTORS
RADIATIONS
REFLECTIVITY
SCATTERING
SPECTROMETERS
SPECTROSCOPY
SUBSTRATES
SURFACE PROPERTIES
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY