Damage to fused silica windows while under simultaneous exposure to flowing solvents and laser radiation and 308nm
This paper reports the results of a study to determine the degrading effects of flowing dye solvents on the laser damage threshold of fused-silica windows at 308nm. Thresholds were measured at the SiO/sub 2/solvent interface in a test cell. Bare SiO/sub 2/ tested in air at 308nm (20ns) typically exhibits a threshold ranging from 4 to 10 Jcm/sup 2/; with the solvent cyclohexane in contact, a threshold as low as 0.3 Jcm/sup 2/ was measured. The damage data indicate that window lifetime (number of shots) is dependent of fluence at higher levels, and asymptotically approaches infinity at levels near threshold. Dielectric coatings were tested as possible damage-resistent barriers between the solvent and SiO/sub 2/; the results show some improvement in damage threshold. When cyclohexane is replaced with the solvent dioxane, thresholds measured for SiO/sub 2/ windows are within the range cited above for thresholds measured in air.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 5131356
- Report Number(s):
- LA-UR-88-1094; CONF-8710165-14; ON: DE88009146
- Resource Relation:
- Conference: Boulder damage symposium, Boulder, CO, USA, 26 Oct 1987
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SILICA
DAMAGE
WINDOWS
CYCLOHEXANE
DIOXANE
LASER RADIATION
LIFETIME
ORGANIC SOLVENTS
ALKANES
CHALCOGENIDES
CYCLOALKANES
ELECTROMAGNETIC RADIATION
HETEROCYCLIC COMPOUNDS
HYDROCARBONS
MINERALS
OPENINGS
ORGANIC COMPOUNDS
ORGANIC OXYGEN COMPOUNDS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
RADIATIONS
SILICON COMPOUNDS
SILICON OXIDES
SOLVENTS
360604* - Materials- Corrosion
Erosion
& Degradation