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Role of Ultrafine Microstructures in Dynamic Fracture in Nanophase Silicon Nitride

Journal Article · · Physical Review Letters
; ; ; ;  [1]
  1. Concurrent Computing Laboratory for Materials Simulations, Department of Physics and Astronomy and Department of Computer Science, Louisiana State University, Baton Rouge, Louisiana 70803 (United States)
Using 10{sup 6}-atom molecular-dynamics simulations, we investigate dynamic fracture in nanophase Si{sub 3}N{sub 4}. The simulations reveal that intercluster regions are amorphous, and they deflect cracks and give rise to local crack branching. As a result, the nanophase system is able to sustain an order-of-magnitude larger external strain than crystalline Si{sub 3}N{sub 4}. We also determine the morphology of fracture surfaces: For in-plane fracture surface profiles the roughness exponent {zeta}=0.57 and for out-of-plane profiles the exponents {zeta}{sub {perpendicular}}=0.84 and {zeta}{sub {parallel}}=0.75 are in excellent agreement with experiments. {copyright} {ital 1997} {ital The American Physical Society}
DOE Contract Number:
FG05-92ER45477
OSTI ID:
512725
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 11 Vol. 78; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English