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Interaction between implanted ions and intrinsic defects in silica

Conference ·
DOI:https://doi.org/10.1557/PROC-157-519· OSTI ID:5124096
 [1]; ;  [2];  [3]
  1. Belmont Coll., Nashville, TN (USA).
  2. Vanderbilt Univ., Nashville, TN (USA)
  3. Oak Ridge National Lab., TN (USA)

High purity silica (Spectrosil) samples were implanted with Ti, Cr, Mn, Fe and Cu at doses ranging from 1.0 to 5.0 {times} 10{sup 15} ions/cm{sup 2} at 160 keV and 2.6 {mu}A/cm{sup 2}. The optical absorption extinction coefficients per ion were measured from 1.8 to 6.0 eV. In all samples there was an increase in absorption over the unimplanted sample at energies {ge}4.6 eV. The increase in absorption at 5.1 eV and 5.7 eV is attributed to B{sub 2}(E{double prime}) centers and E{prime} centers respectively. The relative values of the extinction coefficients of these bands are attributed to the relative oxygen activities of the TMI relative to the SiO{sub 2} host substrate. 13 refs., 4 figs., 2 tabs.

Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE/ER; NSF
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5124096
Report Number(s):
CONF-891119-91; ON: DE90006569; CNN: DMR-8513731
Country of Publication:
United States
Language:
English