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Title: Longevity of optically activated, high gain GaAs photoconductive semiconductor switches

Conference ·
OSTI ID:508103

The longevity of high gain GaAs photoconductive semiconductor switches (PCSS) has been extended to well over 10 million pulses by reducing the density of carriers at the semiconductor to metal interface. This was achieved by reducing the density in the vertical and lateral directions. The first was achieved by varying the spatial distribution of the trigger light thereby widening the current filaments that are characteristic of the high gain switches. The authors reduced the carrier density in the vertical direction by using ion implantation. These results were obtained for currents of about 10 A, current duration of 3.5 ns, and switched voltage of {approximately}2 kV. At currents of {approximately}70 A, the switches last for 0.6 million pulses. In order to improve the performance at high currents new processes such as deep diffusion and epitaxial growth of contacts are being pursued. To guide this effort the authors measured a carrier density of 6 x 10{sup 18} electrons (or holes)/cm{sup 3} in filaments that carry a current of 5 A.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
508103
Report Number(s):
SAND-96-2891C; CONF-9706113-5; ON: DE97007914; TRN: 97:004655
Resource Relation:
Conference: 11. IEEE international pulsed power conference, Baltimore, MD (United States), 29 Jun - 2 Jul 1997; Other Information: PBD: 1997
Country of Publication:
United States
Language:
English