Mechanistic analysis of time-dependent failure of oxynitride glass-joined silicon nitride below 1000 degree C

Journal Article · Tue Jan 01 04:00:00 EST 1991 · Journal of the American Ceramic Society; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1991.tb07304.x· OSTI ID:5058512

O'Brien, M H ^[1]; Coon, D M ^[2]

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1. EG and G Idaho, Inc., Idaho Falls, ID (US)
2. Dept. of Mechanical Engineering, Univ. of Wyoming, Laramie, WY (US)

Time-dependent failure at elevated temperatures currently governs the service life of oxynitride glass-joined silicon nitride. Creep, devitrification, stress- aided oxidation-controlled slow crack growth, and viscous cabitation-controlled failure are examined as possible controlling mechanisms. Creep deformation failure is observed above 1000{degrees}C. Fractographic evidence indicates cavity formation and growth below 1000{degrees}C. Auger electron spectroscopy verified that the oxidation rate of the joining glass is governed by the oxygen supply rate. Time-to-failure data and those predicted using the Tsai and Raj, and Raj and Dang viscous cavitation models. It is concluded that viscous relaxation and isolated cavity growth control the rate of failure in oxynitride glass-filled silicon nitride joints below 1000{degrees}C. Several possible methods are also proposed for increasing the service lives of these joints.

• OSTI ID: 5058512
• Journal Information: Journal of the American Ceramic Society; (United States), Journal Name: Journal of the American Ceramic Society; (United States) Vol. 74:1; ISSN JACTA; ISSN 0002-7820
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360203* -- Ceramics
Cermets
& Refractories-- Mechanical Properties
AUGER ELECTRON SPECTROSCOPY
CAVITATION
CERAMICS
CHEMICAL REACTIONS
CRACKING
DECOMPOSITION
ELECTRON SPECTROSCOPY
GLASS
MECHANICAL PROPERTIES
NITRIDES
NITROGEN COMPOUNDS
OXIDATION
PNICTIDES
PYROLYSIS
SILICON COMPOUNDS
SILICON NITRIDES
SPECTROSCOPY
THERMOCHEMICAL PROCESSES
TIME DEPENDENCE