Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Pressure-induced resonance broadening of exciton line shapes in semiconductors: Direct determination of intervalley scattering rates in GaAs

Journal Article · · Physical Review, B: Condensed Matter; (United States)
; ; ;  [1]
  1. Department of Physics and Astronomy, University of Missouri, Columbia, Missouri (USA)
We show that the exciton photoluminescence line shape in the GaAs/Al{sub {ital x}}Ga{sub 1{minus}{ital x}}As quantum wells under pressure is broadened by hybridization of the {Gamma} exciton with the {ital X} and the {ital L} continua via electron-phonon coupling. Furthermore, we demonstrate the pressure tuning of the resonance-broadening effect which can be used to extract the electron-phonon coupling parameters directly. For GaAs we estimate the intervalley electron-phonon deformation potential {ital D}{sub {Gamma}{ital X}} to be 10.7{plus minus}0.7 eV/A. The resonance effect should be observable in other semiconductors as well.
DOE Contract Number:
FG02-89ER45402
OSTI ID:
5057067
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 44:20; ISSN 0163-1829; ISSN PRBMD
Country of Publication:
United States
Language:
English