Multivariate statistical analysis of spectrum lines from Si{sub 3}N{sub 4} grain boundaries
- Oak Ridge National Lab., TN (United States). Metals and Ceramics Div.
It is well known that the high-temperature properties of polycrystalline Si{sub 3}N{sub 4} ceramics are strongly influenced by the nanometer-scale glassy phase at the grain boundaries. The authors have recently analyzed the variation of the near-edge fine structure (ELNES) of the Si-L{sub 2,3} edges using a combination of TEM spectrum-line acquisition with an imaging filter and multivariate statistical analysis. The glassy phase at the Si{sub 3}N{sub 4} grain boundaries is easily damaged by the fine probes usually used in scanning transmission electron microscopy to acquire ELNES data. Thus an alternative method using a Gatan imaging filter (GIF), called TEM spectrum-line analysis, was used. This technique will be used to correlate variations in grain boundary chemistry and bonding with the observed performance of Si{sub 3}N{sub 4} ceramics.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 505345
- Report Number(s):
- CONF-970834--16; ON: DE97005140
- Country of Publication:
- United States
- Language:
- English
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