Spectrum lines across planar interfaces by energy-filtered TEM
- Oak Ridge National Lab., TN (United States)
Electron energy-loss spectrum imaging, in which a spectrum is recorded for each pixel as a focused probe is digitally rastered in a two-dimensional pattern on the specimen, has developed into a practical and powerful microanalytical technique. However, even for only a modest number of pixels, acquisition times can become inconveniently long. One-dimensional data (spectrum lines) are often sufficient for many materials science applications, especially for planar interfaces. As well as producing energy-filtered TEM images (or diffraction patterns), Gatan imaging filter (GIF{trademark}) can be used to acquire spectrum lines in the TEM mode, without the need to form a small probe. Results from an oxidized CoO-ZrO{sub 2} directionally solidified eutectic that was previously characterized by TEM and electron energy-loss spectrometry illustrate the technique.
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 468864
- Report Number(s):
- CONF-960877--
- Country of Publication:
- United States
- Language:
- English
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