A simple scheme for the minimization of the impact of shorting defects in large-area thin-film integrated arrays
Conference
·
· Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
OSTI ID:5050242
Randomly distributed shorting defects can become the dominating factor limiting the production yield of largearea thin-film solar cells. This paper describes a simple scheme to deal with the problem. By dividing a large-area monolithically integrated array into a parallel combination of subarrays, the detrimental effect of shorting defects can be dramatically reduced. For example, a 1000 cm/sup 2/ integrated array consisting of 60 cells in a series and having a defect density of 2 X 10/sup -2/ cm/sup -2/ is expected to lose 45% of its efficiency. By dividing the array into 10 subarrays, the efficiency loss is reduced to 4%.
- Research Organization:
- Eastman Kodak Company, Rochester, New York
- OSTI ID:
- 5050242
- Report Number(s):
- CONF-840561-
- Conference Information:
- Journal Name: Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States)
- Country of Publication:
- United States
- Language:
- English
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