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The ion sensitivity of boron implanted silicon nitride chemical sensors

Journal Article · · Journal of the Electrochemical Society; (USA)
DOI:https://doi.org/10.1149/1.2096384· OSTI ID:5049948
; ;  [1]
  1. Lehigh Univ., Bethlehem, PA (USA). Sherman Fairchild Lab.
Silicon nitride has been widely used as a pH sensing insulator on the gate of the ion sensitive field effect transistor (ISFET) employed in CMOS integrated chemical sensors. In this paper, the authors report experimental results on the H/sup +/ sensitivity of heavily boron-implanted silicon nitride (Si/sub 3/N/sub 4/). Ion implantation provides a microelectronics technology compatible approach to modify the surface of insulators and tailor the ion sensitivity of ISFETs. This work has suggested new possibilities to study the multiple-site site-binding model for blocking insulators. The composition of the surface sites (nature and number of sites), can be conveniently controlled by implant ion species and dose.
OSTI ID:
5049948
Journal Information:
Journal of the Electrochemical Society; (USA), Journal Name: Journal of the Electrochemical Society; (USA) Vol. 136:10; ISSN JESOA; ISSN 0013-4651
Country of Publication:
United States
Language:
English