Ultra-fast voltage comparators for transient waveform analysis
- Lawrence Berkeley Lab., CA (USA)
- Los Alamos National Lab., NM (USA)
The time at which an input signal crosses the reference level of a voltage comparator can be used in the analog-to-digital conversion of fast single waveform transients. In such a converter, an array of identical comparators, properly biased, provides stop inputs to a picosecond resolution multistop time digitizer. Each stop represents a point in the voltage-time reconstruction of the measured waveform. A number of state-of-the-art comparators, bipolar and GaAs, have been evaluated for this application to determine the differences in their time propagation as a function of the input signal overdrive and risetime. Normalized data are presented to assist in the correction of a digitizer's measurement errors. A picosecond time resolution measurement system used in the tests is also described. 2 refs., 12 figs.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- Sponsoring Organization:
- DOE/ER
- DOE Contract Number:
- AC03-76SF00098; W-7405-ENG-36
- OSTI ID:
- 5035678
- Report Number(s):
- LBL-27065; CONF-900143--15; ON: DE90006106
- Country of Publication:
- United States
- Language:
- English
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Ultra-fast voltage comparators for transient waveform analysis
Evaluation of fast voltage discriminators in the picosecond time range
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Conference
·
Sat Mar 31 23:00:00 EST 1990
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
·
OSTI ID:6582065
Evaluation of fast voltage discriminators in the picosecond time range
Conference
·
Thu Mar 31 23:00:00 EST 1988
·
OSTI ID:6413823
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Journal Article
·
Sat Nov 30 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5705991
Related Subjects
42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
ACCURACY
ANALOG-TO-DIGITAL CONVERTERS
ARSENIC COMPOUNDS
ARSENIDES
COMPARATIVE EVALUATIONS
DATA PROCESSING
DESIGN
ELECTRIC POTENTIAL
ELECTRONIC EQUIPMENT
EQUIPMENT
FREQUENCY ANALYSIS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
MEASURING INSTRUMENTS
MEASURING METHODS
PERFORMANCE TESTING
PNICTIDES
PROCESSING
RECOMMENDATIONS
RELIABILITY
SAMPLING
SIGNALS
TESTING
TRANSIENTS
WAVE FORMS
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
ACCURACY
ANALOG-TO-DIGITAL CONVERTERS
ARSENIC COMPOUNDS
ARSENIDES
COMPARATIVE EVALUATIONS
DATA PROCESSING
DESIGN
ELECTRIC POTENTIAL
ELECTRONIC EQUIPMENT
EQUIPMENT
FREQUENCY ANALYSIS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
MEASURING INSTRUMENTS
MEASURING METHODS
PERFORMANCE TESTING
PNICTIDES
PROCESSING
RECOMMENDATIONS
RELIABILITY
SAMPLING
SIGNALS
TESTING
TRANSIENTS
WAVE FORMS