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Interpretation of the dose and LET dependence of RBE values for lethal lesions in yeast cells

Journal Article · · Radiat. Res.; (United States)
DOI:https://doi.org/10.2307/3576283· OSTI ID:5019944
Survival data on yeast cells proficient or deficient in the repair of DNA double-strand breaks (dsb) and data on the induction of dsb are used to interpret the dose dependence of the RBE value for lethal lesions after irradiation at high dose rate followed by 72-hr liquid holding providing optimum conditions for repair of potentially lethal lesions (RBE/sub DP/, DP = delayed plating). The radiations applied are conventional (150 kV), soft (50 kV), and ultrasoft (4 kV) X rays, 30-MeV electrons (or /sup 60/Co ..gamma.. rays), and 3.5-MeV ..cap alpha.. particles. Analysis shows that the dose dependence of the RBE/sub DP/ value can be explained by the combination of two dose-independent RBE values, one for the single-particle traversal effect (RBE/sub spt/) and the other for the accumulation of dsb (RBE/sub dsb/) due to the traversal of more than one particle though the cell nucleus. Furthermore, it is shown that the LET dependence of RBE/sub spt/ values describing the linear component of the lethal lesions must be considered separately for ''electron'' and ''particle'' radiations.
Research Organization:
Abteilung fuer Biophysikalische Strahlenforschung, Frankfurt, West Germany
OSTI ID:
5019944
Journal Information:
Radiat. Res.; (United States), Journal Name: Radiat. Res.; (United States) Vol. 97:2; ISSN RAREA
Country of Publication:
United States
Language:
English

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