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X-ray-absorption fine structure in embedded atoms

Journal Article · · Physical Review, B: Condensed Matter; (United States)
 [1]; ;  [2];  [1]
  1. Department of Physics, University of Washington, Seattle, Washington 98195 (United States)
  2. Department of Physics, University of California Santa Cruz, Santa Cruz, California 95064 (United States)
Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine-structure (XAFS) measurements. This atomic XAFS (AXAFS) arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and measurements confirm the existence of AXAFS and show that it can dominate contributions such as multielectron excitations. The structure is sensitive to chemical effects and thus provides a probe of bonding and exchange effects on the scattering potential.
DOE Contract Number:
FG06-90ER45415
OSTI ID:
5006965
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 49:17; ISSN PRBMDO; ISSN 0163-1829
Country of Publication:
United States
Language:
English

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