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X-ray reflectivity studies of the metal/solution interphase

Conference ·
OSTI ID:5003825
We have designed an electrochemical cell that permits x-ray scattering studies in a transmission geometry under in-situ electrochemical control and have performed x-ray specular reflectivity studies of several metal/solution interphases as a function of electrochemical potential. For the copper/solution interphase, we found that the reflectivity changes upon oxidation and reduction, indicating a phase transition between copper and copper oxide at the interphase. We also found that the thickness of the pure copper and the roughness of the interfaces exhibited electrochemical irreversibility that is consistent with the potentials for the oxidation waves in the anodic sweep and the reduction waves in the cathodic sweep of the voltammogram. A standard Fresnel expression for the x-ray specular reflectivity was applied in the data analysis, and a smoothly varying Lorentzian interface profile was used for the individual rough interfaces. Furthermore, an incoherent average was used to include the effect of correlated roughness between a pair of interfaces. Preliminary results are also presented for the silver/solution and platinum/solution interphases. 14 refs., 9 figs., 2 tabs.
Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5003825
Report Number(s):
ANL/BC-72031; CONF-9110242--1; ON: DE92001980
Country of Publication:
United States
Language:
English