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Title: Interactions of structural defects with metallic impurities in multicrystalline silicon

Conference ·
OSTI ID:495693
 [1]; ;  [2]; ;  [3]
  1. Lawrence Berkeley National Lab., CA (US). Advanced Light Source
  2. Univ. of California, Berkeley, CA (US). Dept. of Materials Science and Mineral Engineering
  3. ASE Americas Inc., Billerica, MA (US)

Interactions between structural defects and metallic impurities were studied in multicrystalline silicon for solar cells applications. The objective was to gain insight into the relationship between solar cell processing, metallic impurity behavior and the resultant effect on material/device performance. With an intense synchrotron x-ray source, high sensitivity x-ray fluorescence measurements were utilized to determine impurity distributions with a spatial resolution of {approx} 1{micro}m. Diffusion length mapping and final solar cell characteristics gauged material/device performance. The materials were tested in both the as-grown state and after full solar cell processing. Iron and nickel metal impurities were located at structural defects in as-grown material, while after solar cell processing, both impurities were still observed in low performance regions. These results indicate that multicrystalline silicon solar cell performance is directly related to metal impurities which are not completely removed during typical processing treatments. A discussion of possible mechanisms for this incomplete removal is presented.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Advanced Light Source (US)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
495693
Report Number(s):
LBNL-39712; CONF-961202-113; LBNL/ALS-610; ON: DE97006572; TRN: US200210%%6
Resource Relation:
Conference: 1996 Fall meeting of the Materials Research Society, Boston, MA (US), 12/02/1996--12/06/1996; Other Information: Supercedes report DE97006572; PBD: Nov 1996; PBD: 1 Nov 1996
Country of Publication:
United States
Language:
English