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U.S. Department of Energy
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Semiconductor x-ray spectrometer system type 454

Technical Report ·
OSTI ID:4937462

The Type 454 semiconductor detector x-ray spectrometer provides a resolution of 220 eV FWHM for the Fe K/sub alpha / x-ray line at count rates up to 10/sup 4/ pulses per second, and is suitable for the enengy range 4 to 60 keV. The preamplifier uses the pulsed optical feedback technique and a remounted input field effect transistor which operates at 130 K. The detectors are fabricated from commercially available hyper-pure n-type silicon and do not suffer from the carrier trapping effects exhibited by some lithium drift compensated silicon detectors at temperatures approaching 77 K. The high initial cost of this material is offset by savings in manufacturing time and in the cost of the sophisticated equipment required for lithium drift compensation of p-type silicon. (auth)

Research Organization:
Australian Atomic Energy Commission Research Establishment, Lucas Heights
Sponsoring Organization:
Sponsor not identified
NSA Number:
NSA-29-018470
OSTI ID:
4937462
Report Number(s):
AAEC/E--297
Country of Publication:
Australia
Language:
English