Revised model of thermally stimulated current in MOS capacitors
Conference
·
OSTI ID:484580
It is shown analytically and experimentally that thermally stimulated current (TSC) measurements at negative bias incompletely describe oxide-trap charge in SIMOX and bipolar base oxides irradiated at 0 V. Positive-bias TSC is also required.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States); USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 484580
- Report Number(s):
- SAND--97-1332C; CONF-970711--9; ON: DE97006359
- Country of Publication:
- United States
- Language:
- English
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